pISSN : 1598-706X / eISSN : 2288-8381
한국주조공학회지 (33권2호 69-74)
SiC Contaminations in Polycrystalline-Silicon Wafer Directly Grown from Si Melt for Photovoltaic Applications
실리콘 용탕으로부터 직접 제조된 태양광용 다결정 실리콘의 SiC 오염 연구
Ye-Neung Lee, Bo-Yun Jang, Jin-Seok Lee, Joon-Soo Kim, Young-Soo Ahn, Woo-Young Yoon*
Korea Institute of Energy Research, Korea University*
Silicon, Wafer, Direct growth, Contamination, Silicon carbide